The power electronics market is being driven by stricter efficiency targets, higher power densities and
increasing integration with large-scale power grids. Consequently, engineers must cope with non-ideal
component behavior, fast transient stresses on wide-bandgap devices and ever more demanding EMC
requirements. The conference will address these challenges by presenting measurement-centric solutions
that can be implemented with modern oscilloscopes, vector network analyzers and precision power
analyzers.

The program opens on May 5 with a keynote by Tobias Keller (Hitachi Energy) entitled “Power
Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades”. Tobias
Keller will discuss the qualification of silicon and silicon carbide (SiC) devices for high-voltage grid
applications, focusing on thermal cycling, short-circuit robustness and long-term reliability data.
A second keynote, delivered on May 6 by Veit Hellwig (Infineon Technologies), will examine the impact of
gallium-nitride (GaN) technology on high-voltage motor inverter topologies.

In addition to the keynotes, the conference comprises a series of technical sessions. One presentation will
analyze passive component characterization, highlighting methods for extracting parasitic inductance and
capacitance at frequencies above 100 MHz and demonstrating the influence of these non-idealities on
converter stability. Another session will detail automated dynamic characterization of SiC and GaN power
devices, showing how double-pulse test rigs can be synchronized with high-speed digitizers to reduce
measurement uncertainty and to capture fast recovery behavior.

Electromagnetic compatibility topics are covered in two dedicated talks. The first provides practical guidance
on the use of near-field probes for pinpointing radiated emission sources and for validating the effectiveness
of EMI filter designs. The second demonstrates a complete conducted emission measurement workflow on a
small-scale prototype, using a Line Impedance Stabilization Network (LISN) together with a modern mixed
signal oscilloscope. The presenter will also outline a filter design methodology that exploits the time
frequency capabilities of the instrument.

A further webinar addresses the growing need for accurate efficiency measurement in data center and AI
server power supplies. By employing precision power analyzers capable of tracking distorted waveforms and
rapid load transients, participants will learn how to obtain true input and output power values that satisfy
80 PLUS certification requirements.

The last session focuses on harmonic current and voltage flicker compliance for low-voltage, grid-connected
products. The speaker will review the limits and test procedures defined in IEC/EN 61000-3-2/-3-3 and
IEC/EN 61000-3-12/-3-11, and will demonstrate how integrated compliance testing software linked to a
power analyzer can deliver automated pass/fail decisions from early prototype evaluation through to final
type approval.

Speakers include subject matter experts from Rohde & Schwarz, Hitachi, Infineon, PE-Systems,
Würth Elektronik and the Universities of Bremen and Zaragoza. Their contributions combine academic insight
with industrial experience, providing attendees with both theoretical background and hands-on measurement
strategies.

The conference is free of charge, but registration is required. The full agenda, speaker biographies and the
registration portal are available at: http://www.rohde-schwarz.com/power-electronics-conference